Research on the multi-crystalline structure in sapphire grown by Kyropoulos technique

The macroscopic distribution of multi-crystalline structure (MCS) in a sapphire boule grown by Kyropoulos technique was characterized using polariscope. The morphology and texture of subgrains from [0001], [11 (2) over bar0] and [(1) over bar 100] orientations were investigated using Synchrotron radiation white-beam topography technique. The morphology of subgrains was found to be diverse from crystallographic orientation. The relative angles between subgrains are smaller than 1 degrees. The defect structure on a basal-plane specimen from the lower part of the "shoulder" was examined by X-ray rocking curve and chemical etching technique. It was found that the defect concentration changes drastically near MCS center. The nature of spatial distribution of MCS and the defect distribution near MCS in a grown boule was discussed in detail.