INSTRUMENTS AND METHODS OF INVESTIGATION: Scanning tunneling microscopy of fullerenes on metal and semiconductor surfaces
1997
Keywords:
- Conductive atomic force microscopy
- Electrochemical scanning tunneling microscope
- Scanning confocal electron microscopy
- Scanning probe microscopy
- Scanning tunneling spectroscopy
- Scanning tunneling microscope
- Scanning ion-conductance microscopy
- Analytical chemistry
- Spin polarized scanning tunneling microscopy
- Materials science
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