Development of low-energy X-ray spectrometry at the Laboratoire National Henri Becquerel

M.C. Lepy,J. Plagnard

Development of low-energy X-ray spectrometry at the Laboratoire National Henri Becquerel

2007

M.C. Lepy
J. Plagnard

Resumen en: In the frame of the French Metrology Institute, the Laboratoire National Henri Becquerel performs accurate characterization of semiconductor detectors t...

Keywords:

Mass spectrometry
Optics
X-ray
Calibration
low energy
Metrology
Semiconductor detector
Becquerel
Physics

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