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Dependence of 1.5 μm PL on Si substrate orientation in Si/β-FeSi 2 /Si stacked structures
Dependence of 1.5 μm PL on Si substrate orientation in Si/β-FeSi 2 /Si stacked structures
2018
Shuya Ikeda
Naohiro Oka
Kazuya Ogi
Kenta Setojima
Yoshikazu Terai
Keywords:
Crystallography
Substrate (chemistry)
Materials science
iron disilicide
si substrate
Correction
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