First Beam Test of Nanometer Spot Size Monitor Using Laser Interferometry

The nanometer spot size monitor based on the laser interferometry (Laser-Compton Spot Size Monitor) has been tested in FFTB beam line at SLAC. A low emittance beam of 46 GeV electrons, provided by the two-mile linear accelerator, was focused into nanometer spot in the FFTB line, and its transverse dimensions were precisely measured by the spot size monitor.