Critical current in nonhomogeneous YBCO coated conductors

The critical current of an YBCO tape is determined by the magnetic field inside the YBCO layer and the quality of YBCO material. In thick YBCO layers the average critical current density is reduced by the self-field and decreased material quality. In this paper the combined influence of the material nonhomogeneities and self-field on the critical current of YBCO tapes is scrutinised. First, the zero field critical current density was assumed to decrease along the YBCO thickness. Secondly, the possible defects created in the cutting of YBCO tapes were modelled as a function of lowered critical current density near the tape edges. In both cases the critical current was computed numerically with integral element method. The results suggest that the variation of zero field critical current density, Jc0, along the tape thickness does not effect on the critical current if the mean value of Jc0 is kept constant. However, if Jc0 is varied along the tape width the critical current can change due to the variated self-field. The computations can be used to determine when it is possible to evaluate the average zero field critical current density from a voltage-current measurement with an appropriate accuracy.