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Comparative study of C–V-based extraction methods of interface state density for a low-temperature polysilicon thin film
Comparative study of C–V-based extraction methods of interface state density for a low-temperature polysilicon thin film
2021
Woohui Lee
Joohee Oh
Jae Hwan Chu
Sanggun Choi
Tae Wook Kang
Hyeyong Chu
Hyoungsub Kim
Keywords:
extraction methods
Thin film
Materials science
state density
Interface (Java)
Optoelectronics
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