Equally sloped tomography based X-ray full-field nano-CT at Shanghai Synchrotron Radiation Facility

Abstract X-ray full-field nano-computed tomography (nano-CT) has non-destructive three-dimensional imaging capabilities with high spatial resolution, and has been widely applied to investigate morphology and structures in various areas. Conventional tomography reconstructs a 3D object from a large number of equal-angle projections. For nano-CT, it takes long collecting time due to the large projection numbers and long exposure time. Here, equally-sloped tomography (EST) based nano-CT was implemented and constructed on X-ray imaging beamline at the Shanghai Synchrotron Radiation Facility (SSRF) to overcome or alleviate these difficulties. Preliminary results show that hard TXM with the spatial resolution of 100 nm and the EST-based nano-CT with the ability of 3D nano non-destructive characterization have been realized. This technique promotes hard X-ray imaging capability to nano scales at SSRF and could have applications in many fields including nanomaterials, new energy and life sciences. The study will be helpful for the construction of the new full field X-ray nano-imaging beamline with the spatial resolution of 20 nm at SSRF phase II project.