Dielectric Properties and Microwave Drying Characteristics of CuCl Residue

The basics of microwave drying process of CuCl residue were studied by comparing the dielectric property of the residue with different moisture contents. The dielectric properties were measured by microwave cavity perturbation method. The dielectric constant and dielectric loss factor of the CuCl residue have a linear correlation with the moisture content. With this relationship, we can realize on-line measurement of moisture content of the CuCl residue by dielectric properties. The microwave drying experiments with different thicknesses (1–5cm) of CuCl residue were carried out, and the heating curve of the materials under different microwave powers (250–450W) was made. From these parameters, an optimized operation parameter of microwave roasting technology, the thickness of CuCl residue filter cake to be microwave roasted should be 2cm, was deduced.