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Industrial and Body Diode Qualification of Gen-III Medium Voltage SiC MOSFETs: Challenges and Solutions
Industrial and Body Diode Qualification of Gen-III Medium Voltage SiC MOSFETs: Challenges and Solutions
2019
Edward Van Brunt
Michael J. O'Loughlin
Al Burk
Brett Hull
Sei-Hyung Ryu
Jim Richmond
Yuri I. Khlebnikov
Elif Balkas
Donald A. Gajewski
Scott Allen
John W. Palmour
Keywords:
Diode
Engineering physics
Metallurgy
Materials science
Voltage
qualification testing
Correction
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