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Characterizing Switching Variability in TaOx Resistive Memories.
Characterizing Switching Variability in TaOx Resistive Memories.
2015
David Russell Hughart
Patrick R. Mickel
Roger Apodaca
Gad S Haase
Farid El Gabaly Marquez
A. Alec Talin
Conrad D. James
Matthew Marinella
Keywords:
Electronic engineering
Materials science
Resistive touchscreen
Optoelectronics
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