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arXiv : Mapping the depleted area of silicon diodes using a micro-focused X-ray beam
arXiv : Mapping the depleted area of silicon diodes using a micro-focused X-ray beam
2019
L. Poley
Andrew Blue
I. Bloch
C.M. Buttar
V Fadeyev
J. Fernández-Tejero
C. Fleta
J Hacker
C. Lacasta Llacer
Mercedes Minano
M. Renzmann
E. Rossi
C. Sawyer
Dennis Sperlich
Martin Stegler
M. Ullan
Yoshinobu Unno
Keywords:
Optics
Physics
Diode
Silicon
Beam (structure)
X-ray
Correction
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