Scanning electron acoustic microscopy (SEAM): A technique for the detection of contact-induced surface & sub-surface cracks
2004
A variant of the scanning acoustic microscopy technique, scanning electron acoustic microscopy (SEAM), uses a pulsed electron beam in a conventional scanning electron microscope (SEM) to generate elastic waves near the surface of the sample. Conveniently for studies of surface damage, the contrast-generating processes are at a depth commensurate with the thickness of many thin hard ceramic coatings and the typical depths of fatigue-induced cracks in both gears and rolling element bearing systems.
Keywords:
- Scanning confocal electron microscopy
- Composite material
- Materials science
- Scanning ion-conductance microscopy
- Acoustic microscopy
- Conventional transmission electron microscope
- Scanning transmission electron microscopy
- Environmental scanning electron microscope
- Electron beam-induced deposition
- Scanning capacitance microscopy
- Optics
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