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Summary Abstract: Characterization of growth parameters in strained‐layer superlattices using Raman scattering
Summary Abstract: Characterization of growth parameters in strained‐layer superlattices using Raman scattering
1988
G. P. Schwartz
G. J. Gualtieri
W. A. Sunder
Keywords:
Analytical chemistry
Raman scattering
Superlattice
Chemistry
Optoelectronics
Optics
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