Research of the influence to the stability factor of third generation experimental tube under illumination
2008
By use of self-developing more-information measurement instrument, stability under illumination of
transmission-mode GaAs photocathode sealed in the third generation intensifier was researched and analyzed. The
spectral response curves under ebb-illumination 10 lx and strong-illumination 100 lx were obtained with illumination time.
The results show that during initial several weak illuminations photocathode behaves no obvious decay and a maximum
sensitivity was achieved, while under intense illumination the sensitivity of photocathode began to decrease largely at the
first illumination. It was also found that under intense illumination the peak wavelength moved towards short-wave and
peak response decreased, which show that the ability of long-wave response of photocathode is decreased. The
performance parameters of GaAs photocathode were estimated by curve imitate. The result indicated that the variation of
surface escape probability with illumination time is the direct cause of instability of photocathode under illumination, at
the same time, it was found that the illumination increased the ion bombardment probability in GaAs tube, it was the
reason for the decline of the cathode sensitive. The Cs quantity on cathode surface and the purge degree of cathode
subassembly were the important factor to the cathode stability.
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