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Latent Damage in 0. 13 μm Large Scale Integrated Circuit from Transient Latchup Test
Latent Damage in 0. 13 μm Large Scale Integrated Circuit from Transient Latchup Test
2019
Du Chuanhua
Zhao Hongchao
Deng Yan
Keywords:
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Computer science
Integrated circuit
Electrical engineering
Correction
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