Wavefront sensing of XUV beams
2009
For the purpose of the wavefront profile measurement of XUV beams emitting at 21.2 nm and 30 nm, we designed the
PDI (Point Diffraction Interferometer) wavefront sensor. PDI is a self-referencing monolithic device consisting of a thin
neutral filter and a very small pinhole located near the axis of the XUV beam focal spot. The small pinhole works as a
diffraction aperture generating a reference spherical wave, and working as well as a spatial filter. The material of the thin
foil is partially transparent for the XUV radiation, and it determines the visibility of the interference fringes. The
interference pattern is recorded by an XUV detector placed behind the foil. From the information encoded in the pattern
it is possible sequentially to reconstruct the beam wavefront profile. We will discuss the design and optimization of the
PDI wavefront sensor setup.
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