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Suppression of short-channel effects in normally-off GaN MOSFETs with deep recessed-gate structures
Suppression of short-channel effects in normally-off GaN MOSFETs with deep recessed-gate structures
2020
Daimotsu Kato
Yosuke Kajiwara
Akira Mukai
Hiroshi Ono
Aya Shindome
Jumpei Tajima
Toshiki Hikosaka
Masahiko Kuraguchi
Shinya Nunoue
Keywords:
Optoelectronics
Optics
Communication channel
Physics
normally off
Correction
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