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Observation of defects in CuInSe$_{2}$ by 300kV aberration corrected scanning transmission electron microscope
Observation of defects in CuInSe$_{2}$ by 300kV aberration corrected scanning transmission electron microscope
2011
Akane Takeshita
Takayuki Tanaka
Tadahiro Kubota
Hideto Miyake
Hidetaka Sawada
Yukihito Kondo
Yoshifumi Oshima
Y. Tanishiro
Kunio Takayanagi
Keywords:
Dark field microscopy
Environmental scanning electron microscope
Scanning transmission electron microscopy
Conventional transmission electron microscope
Annular dark-field imaging
Electron beam-induced deposition
Electron tomography
Materials science
Electron microscope
Optics
Correction
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