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Fault Isolation of High Resistance Defects Using Comparative Magnetic Field Imaging
Fault Isolation of High Resistance Defects Using Comparative Magnetic Field Imaging
2003
Antonio Orozco
Elena Talanova
Anders Gilbertson
L. A. Knauss
Zhiyong Wang
Lars D. Skoglund
David Smith
Rajen Dias
Keywords:
Fault detection and isolation
Optoelectronics
high resistance
Materials science
Magnetic field imaging
Correction
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