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Impedance spectroscopy analysis of structural defects in sputtered ZnO films
Impedance spectroscopy analysis of structural defects in sputtered ZnO films
2020
Josiane Soares Costa
Michel Prestat
Bernard Tribollet
B. Lescop
S. Rioual
Lorenz Holzer
Dominique Thierry
Keywords:
Dielectric spectroscopy
Materials science
Composite material
Thin film
Zinc
Microstructure
Sputtering
Correction
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