Evaluating alternatives to voltage fluctuation and flicker measurements based on IEC standard 61000-4-15

Recent work completed by CIGRE/CIRED Joint Working Groups C4.108 and C4.111 has pointed to the general conclusion that there is a poor correlation between measured voltage fluctuation levels (“flicker”) and complaints from network customers. Voltage fluctuation measurement procedures have long been standardized in the IEC flickermeter (IEC Standard 61000-4-15) and historically the correlation between the short-term flicker severity value, Pst, provided by any compliant flickermeter and customer complaints has been very good. In recent times, the correlation has become much worse, prompting multiple investigations by international researchers and technical organizations such as CIGRE and CIRED. This paper is intended to provide theoretical and simulation bases which support one particular modification to the flickermeter which could lead to improved correlation between measured flicker levels and customer complaints.