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Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)
1993
B. L. Ballard
P. K. Predecki
D. N. Braski
Keywords:
Crystallography
Cavity magnetron
X-ray crystallography
Materials science
Analytical chemistry
Grazing
Correction
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