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Relation between the microscopic dielectric properties of Si wires and the experimental permittivity of porous Si.
Relation between the microscopic dielectric properties of Si wires and the experimental permittivity of porous Si.
1998
Jose Gonzalo Escobar Lugo
Yuri G. Rubo
J. Tagűeña-Martínez
José Antonio del Río
Keywords:
Dielectric spectroscopy
Dielectric
Permittivity
Materials science
Relative permittivity
Optoelectronics
Composite material
Porosity
Correction
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