Old Web
English
Sign In
Acemap
>
Paper
>
Temperature Dependence of Flicker (1/f) Noise in Analog and Digital 45 nm n-MOSFET Devices
Temperature Dependence of Flicker (1/f) Noise in Analog and Digital 45 nm n-MOSFET Devices
2010
P. Srinivasan
Kamel Benaissa
Frank Hou
Deon Studdard
Samuel Martin
Andrew Marshall
James McKee
Keywords:
Flicker
Flicker noise
MOSFET
Physics
Electronic engineering
Materials science
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]