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Laser-assisted atom probe tomography of MBE grown GaN nanowire heterostructures | NIST
Laser-assisted atom probe tomography of MBE grown GaN nanowire heterostructures | NIST
2014
Norman A. Sanford
Paul T. Blanchard
Matthew D. Brubaker
Kristine A. Bertness
John B. Schlager
R. Kirchofer
David R. Diercks
Brian P. Gorman
Keywords:
Nanowire
Heterojunction
Optoelectronics
Laser
Atom probe
NIST
Materials science
laser assisted
Correction
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