A study between best process focus and machine focus

1997 
The focus window of various topographies and substrate (Borophosphosilicategass, Plasma enhanced Oxide and Al/Si/Cu) was discussed in this paper .Also the electric test data and Cp yield with different focus will be introduced.Finally, the useable depth of focus, auto focus system and simulation model will be applied to describe the deference between machine and process best focus.
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