Snapshot imaging spectropolarimetry in the visible and infrared
2008
Two imaging systems have been designed and built to function as snapshot imaging spectropolarimeters; one system
made to operate in the visible part of the spectrum, the other for the long wavelength infrared, 8 to 12 microns. The
devices are based on computed tomographic imaging channeled spectropolarimetry (CTICS), a unique technology that
allows both the spectra and the polarization state for all of the wavelength bands in the spectra to be simultaneously
recorded from every spatial position in an image with a single integration period of the imaging system. The devices
contain no moving parts and require no scanning, allowing them to acquire data without the artifacts normally associated
with scanning spectropolarimeters. Details of the two imaging systems will be presented.
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