Combined-PSD and LIMM Measurements for Traps Characterization in BoPP Thin Films

Understanding charge trapping phenomena in dielectrics requires a good description of the distribution in density, energetic levels, and if possible nature of the centers stabilizing charges. This topic is of great interest for many application fields as electronics or energy storage. Along this objective, fractionated-PSD (Photo-stimulated discharge) measurements, combined with space charge measurements using LIMM (Light Intensity Modulation Method) are developed in order to discriminate the origin of the different peaks observed in the PSD spectrum of Bi-oriented Polypropylene thin films.