Evaluation of the 1040 x 1040 PtSi CSD for astronomical use

We present the performance of the 1040 by 1040 PtSi CSD manufactured by Mitsubishi Electric Co. for an application of astronomical imaging. The sensor was evaluated both in laboratory and in real observing conditions. The results of noise, quantum efficiency, linearity, dark current and photometric accuracy are presented.© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.