Measured critical resolved shear stress and calculated temperature and stress fields during growth of CdZnTe

Abstract The critical resolved shear stress (CRSS) of Cd 0.46 Zn 0.04 Te 0.50 was measured at elevated temperatures. The temperature and stress fields for the vertical Bridgman growth of CdZnTe were calculated using the finite element method. The measured CRSS and the calculated shear stress are related to dislocation formation in the crystal, during growth.