Old Web
English
Sign In
Acemap
>
Paper
>
Impact of Electrical Stress on Hot-Electron Injection in Ultra-Thin SiO2 Films
Impact of Electrical Stress on Hot-Electron Injection in Ultra-Thin SiO2 Films
1999
Okhonin
Berk
Ils
Fazan
Guegan
Deleonibus
Martin
Keywords:
Hot-carrier injection
Stress (mechanics)
Materials science
Composite material
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]