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Study on the Si(111) √ ×√ - Ag Surface Structure by X-Ray Diffraction : Surfaces, Interfaces and Films
Study on the Si(111) √ ×√ - Ag Surface Structure by X-Ray Diffraction : Surfaces, Interfaces and Films
1988
Toshio Takahashi
Shinichiro Nakatani
Naoko Okamoto
Tetsuya Ishikawa
Seishi Kikuta
Keywords:
Van der Waals radius
Synchrotron radiation
X-ray crystallography
Crystallography
Chemistry
Silicon
Physics
structure analysis
surface structure
Atomic physics
Correction
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