Old Web
English
Sign In
Acemap
>
Paper
>
Investigation of radiation hardness of Si and SiC detectors by Xe ion beam
Investigation of radiation hardness of Si and SiC detectors by Xe ion beam
2017
L. Hrubčín
Yu. B. Gurov
Bohumír Zat’ko
O.M. Ivanov
Semen Mitrofanov
S. V. Rozov
V.G. Sandukovskij
Vasiliy Semin
Vladimir A. Skuratov
Keywords:
Particle detector
Materials science
Charged particle
Ion
Cyclotron
Semiconductor detector
Radiation hardening
Irradiation
Ion beam
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]