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Effect of Stress on Drain Current of 0.13-μm Node MOS Transistors
Effect of Stress on Drain Current of 0.13-μm Node MOS Transistors
2003
Yukihiro Kumagai
Hiroyuki Ohta
Hideo Miura
Akihiro Shimizu
Keywords:
Transistor
Electronic engineering
Materials science
Optoelectronics
drain current
Correction
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