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In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging
In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging
2019
Mikhail Dutka
Romaine Isaacs
Anna Prokhodtseva
Tomáš Vystavěl
Keywords:
Analytical chemistry
Argon
Materials science
In situ
Ion source
low energy
high resolution
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