Old Web
English
Sign In
Acemap
>
Paper
>
In-situ x-ray scattering investigation of strain in thin-film morphological evolution of homoepitaxial Ag(001)
In-situ x-ray scattering investigation of strain in thin-film morphological evolution of homoepitaxial Ag(001)
2010
S.T. Hayden
Chinkyo Kim
Edward H. Conrad
M.W. Gramlich
P. F. Miceli
Keywords:
Thin film
Crystal growth
Scattering
X-ray
Analytical chemistry
Strain (chemistry)
Materials science
Optics
In situ
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]