Impact of emitter resistance mismatch on base and collector current matching in bipolar transistors

Bipolar transistor matching is characterized at medium and high current levels using an HF test structure. We demonstrate the predominant impact of emitter resistance mismatch on base and collector current matching at high current. To this end, we simulate base and collector mismatch thanks to the experimental values of emitter access resistance and its variations. The results of these simulations are successfully compared to the experimental data.