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Study Of The ESD Behavior Of Different Clamp Configurations In A 0.35/spl mu/m Cmos Technology
Study Of The ESD Behavior Of Different Clamp Configurations In A 0.35/spl mu/m Cmos Technology
1997
C. Richier
N. Maene
G. Mabboux
R. Bellens
Keywords:
Electrical engineering
CMOS
Clamp
Electronic engineering
Diode
Electrostatic discharge
Engineering
Charged-device model
Transmission line
Human-body model
Capacitance
Correction
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