One step electrodeposited CZTS thin films: Preparation and characterization

Cu 2 ZnSnS 4 (CZTS) thin films were successfully prepared using a single-step electrodeposition process in aqueous ionic solution, followed by the sulfurization in elemental sulfur vapor ambient at different annealing temperatures and under Argon atmosphere. The structural, morphological, compositional and optical properties of the samples have been investigated. Raman spectroscopy and X-ray diffraction (XRD) have confirmed the Kesterite structure of CZTS films sulfurized at 500 °C. The chemical composition was determined by Rutherford Back Scattering (RBS) and energy dispersive X-ray spectroscopy (EDS) that show the formation of near stoichiometric CZTS thin films. The surface morphology of the samples was examined using scanning electron microscopy (SEM) and atomic force microscopy (AFM). Optical properties of the CZTS thin film were studied by photoluminescence spectroscopy (PL).