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Endurance measurements of LixCoO2-based ReRAM cells
Endurance measurements of LixCoO2-based ReRAM cells
2018
Van Son Nguyen
Van Huy Mai
Moradpour Alexandre
Pascale Auban-Senzier
Claude Pasquier
Kang Wang
Marcelo J. Rozenberg
Nathalie Brun
Katia March
Pierre-Antoine Albouy
John Giapintzakis
C. N. Mihailescu
Evripides Kyriakides
C M Orfanidou
Thomas Maroutian
Guillaume Agnus
Philippe Lecoeur
Silvia Matzen
Pascal Aubert
Sylvain Franger
Raphael Salot
David Alamarguy
Pascal Chrétien
Pavan Nukala
B. Dkhil
Olivier Schneegans
Keywords:
Optoelectronics
Resistive random-access memory
Materials science
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