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Fully quantified, micron-resolution, whole thin section synchrotron XRF mapping of trace elements in geological materials
Fully quantified, micron-resolution, whole thin section synchrotron XRF mapping of trace elements in geological materials
2011
James S. Cleverley
R Hough
Louise Fisher
Chris Ryan
P. Bland
Keywords:
Synchrotron
Mineralogy
Materials science
geological materials
Thin section
Micrometre
Correction
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