Thermally Stimulated Exoelectron Emission of Evaporated LiF Films

The authors would like to thank Mr. M. Fujisawa of Synchrotron Radiation Laboratory of IS SP, University of Tokyo for reflectivity measurements, Prof. T. Saito, Tokyo University of Agriculture and Technology, for ellipsometry measurements, and Stanley Electric Co., Ltd. for EPMA measurements. This work has been partly supported by the financial contribution from Nippon Steel Co., Ltd.