Layer growth and dynamics of xenon films deposited on Ag(111)
1988
We have used a surface-plasmon-resonance technique to probe Xe multilayer-film growth dynamics on vapor-deposited Ag(111) from 67 to 85 K. At low T, more than 10 statistical layers are observed, but above 75 K, films complete only about 2 layers before nucleating islands. We discuss activation energies, long-term instabilities, and annealing trends, and show that the isalnd nucleation correlates with underlying features of the substrate.
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