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Evaluation of Electronic States of Resistive Random Access Memory Using Low-Frequency-Noise Spectroscopy
Evaluation of Electronic States of Resistive Random Access Memory Using Low-Frequency-Noise Spectroscopy
2021
Kota Sugawara
Hiroshi Suga
Yasuhisa Naitoh
Hisashi Shima
Hiroyuki Akinaga
Keywords:
Materials science
Infrasound
Resistive random-access memory
Spectroscopy
Optoelectronics
electronic states
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