A Physically Unclonable Function with BER < 0.35% for Secure Chip Authentication Using Write Speed Variation of RRAM

We propose a reliable design of physically unclonable function (PUF) utilizing the write speed variation of RRAM for the first time. The demonstration is carried out on a 256Kb test macro of HfO 2 /WOx bi-layer RRAM which was fabricated based on 0.13 μm logic process. The proposed RRAM PUF is capable of regenerating more than $10^{15}$ times after 10 years at 125°C. The bit error rate (BER) remains $ from −25 to 125°C. The average inter-chip hamming distance (HD) is 0.5002 and the intra-chip HD is 0. The energy efficiency is 0.11 pJ/bit.