A precision low-power analog front end in 180 nm CMOS for wireless implantable capacitive pressure sensors

Abstract This paper presents a new capacitance to voltage analog-front end (AFE) designed in 180 nm CMOS technology for wireless implantable applications. This AFE consists of a Low-dropout regulator (LDO), bandgap reference (BGR), switched-capacitor (SC) sampler, SC op-amp and oscillator. The LDO regulates the wireless power supply coming from an off-chip rectifier and provides a stable and accurate DC voltage. Capacitance is converted to a discrete voltage by a SC sampling circuit and then amplified by a SC op-amp. Both of SC sampling and SC op amp circuits form a correlated double sampling scheme. This AFE is designed to sense a capacitance range from 6 pF to 7 pF (300–1000 mmHg) corresponding to a 0.68 V–1.07 V discrete output voltage with a sampling frequency of 1.63 KHz. This AFE has a sensitivity of 0.39 mV/fF, average power consumption of 201 μW and 3.25% accuracy operating over a 2.1 V–3.3 V rectified wireless supply voltage and −40 °C ~125 °C temperature range.