Old Web
English
Sign In
Acemap
>
Paper
>
Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy
Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy
2019
Manuel Ulreich
L.A. Boatner
Igor Sokolović
Michele Reticcioli
Berthold Stoeger
Flora Poelzleitner
Cesare Franchini
Michael Schmid
Ulrike Diebold
Martin Setvin
Keywords:
Optoelectronics
Dopant
Scintillator
Microscopy
Correction
Cite
Save
Machine Reading By IdeaReader
41
References
0
Citations
NaN
KQI
[]