EXAFS of titanium LIII edge using a compact laboratory system based on a laser-plasma soft X-ray source

We present results of applying a compact laboratory system based on a laser-plasma soft X-ray (SXR) source to the extended X-ray absorption fine structure (EXAFS) spectroscopy of titanium in the vicinity of the LIII absorption edge. The source, operating with a plasma produced as a result of irradiation a krypton/helium double-stream gas-puff target, was optimized for an intense emission in the spectral range between 200 and 700 eV. A broad SXR spectrum and high photon flux are indispensable in the EXAFS studies. The experimental setup assured the simultaneous acquisition of both the reference and the absorption spectra. A grazing-incidence flat-field spectrometer was used to record the spectra. The absorption spectra of a thin (200-nm thick) titanium sample revealed the features in the EXAFS region allowing for quite accurate determination of the radial distances between the atoms. Results are in good agreement with the output of numerical modeling based on photoelectron wave function scattering and with the data reported for using a synchrotron source. This confirms the suitability of the source for using it in the standard EXAFS method.