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A Study on the Test Method of Local Information Processing Device in Digital Substation Based on IEC 61850
A Study on the Test Method of Local Information Processing Device in Digital Substation Based on IEC 61850
2020
Namdae Kim
Woo-Jung Kim
Nam-Ho Lee
Seok-Kon Kim
Byung Tae Jang
Keywords:
IEC 61850
Test method
digital substation
Computer hardware
Computer science
Information processing
Correction
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